NADAtech Sorter+ Options- Wafer Slip Detection (+SlipFinder)
- Wafer slip is detected and measured using propriety Hologenix lighting and software
- Recipes can scan outer wafer edge, center of wafer, both or entire wafer
- 150mm / 200mm / 300mm
- Typical for EPI and SOI mis-process slip detection
- Completely integrated operation and reporting
Sorter+ Options (About)
Add Dual and Triple Functionality to Standard Systems
In addition to standalone wafer automation equipment, it is also possible to extend the functionality of your systems with NADAtech’s various Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of specially designed applications, without needing to add extra equipment to your current production floor. Accordingly, each of these products have been listed separately and can be identified by the preceding heading 'Sorter+ Options'.
- Wafer slip is detected and measured using propriety Hologenix lighting and software
- Recipes can scan outer wafer edge, center of wafer, both or entire wafer
- 150mm / 200mm / 300mm
- Typical for EPI and SOI mis-process slip detection
- Completely integrated operation and reporting
Sorter+ Options (About)
Add Dual and Triple Functionality to Standard Systems
In addition to standalone wafer automation equipment, it is also possible to extend the functionality of your systems with NADAtech’s various Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of specially designed applications, without needing to add extra equipment to your current production floor. Accordingly, each of these products have been listed separately and can be identified by the preceding heading 'Sorter+ Options'.
- Wafer slip is detected and measured using propriety Hologenix lighting and software
- Recipes can scan outer wafer edge, center of wafer, both or entire wafer
- 150mm / 200mm / 300mm
- Typical for EPI and SOI mis-process slip detection
- Completely integrated operation and reporting
Sorter+ Options (About)
Add Dual and Triple Functionality to Standard Systems
In addition to standalone wafer automation equipment, it is also possible to extend the functionality of your systems with NADAtech’s various Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of specially designed applications, without needing to add extra equipment to your current production floor. Accordingly, each of these products have been listed separately and can be identified by the preceding heading 'Sorter+ Options'.
This equipment is advertised on behalf of NADA Technologies, LLC (NADAtech)