NADAtech Sorter+ Options - Scribe Location Inspection (+SLI)
- Option for any system using OCR
- Measures scribe location against a qualified location
- Automated characterization
- Automated inspection
- Function can be added to any typical sorting recipe
- Includes SECS / GEM reporting for X / Y and linear offests
- Limits monitoring and alarms
Sorter+ Options (About)
Add Dual and Triple Functionality to Standard Systems
In addition to standalone wafer automation equipment, it is also possible to extend the functionality of your systems with NADAtech’s various Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of specially designed applications, without needing to add extra equipment to your current production floor. Accordingly, each of these products have been listed separately and can be identified by the preceding heading 'Sorter+ Options'.
- Option for any system using OCR
- Measures scribe location against a qualified location
- Automated characterization
- Automated inspection
- Function can be added to any typical sorting recipe
- Includes SECS / GEM reporting for X / Y and linear offests
- Limits monitoring and alarms
Sorter+ Options (About)
Add Dual and Triple Functionality to Standard Systems
In addition to standalone wafer automation equipment, it is also possible to extend the functionality of your systems with NADAtech’s various Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of specially designed applications, without needing to add extra equipment to your current production floor. Accordingly, each of these products have been listed separately and can be identified by the preceding heading 'Sorter+ Options'.
- Option for any system using OCR
- Measures scribe location against a qualified location
- Automated characterization
- Automated inspection
- Function can be added to any typical sorting recipe
- Includes SECS / GEM reporting for X / Y and linear offests
- Limits monitoring and alarms
Sorter+ Options (About)
Add Dual and Triple Functionality to Standard Systems
In addition to standalone wafer automation equipment, it is also possible to extend the functionality of your systems with NADAtech’s various Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of specially designed applications, without needing to add extra equipment to your current production floor. Accordingly, each of these products have been listed separately and can be identified by the preceding heading 'Sorter+ Options'.
This equipment is advertised on behalf of NADA Technologies, LLC (NADAtech)