NADAtech Sorter+ Options-Automated Optical Inspection(+MIDS)
- NADAtech’s newest Sorter+ Option, designed to meet industry demand
- Module created to help with common visible macro defects
- Add INLINE inspection to your wafer sort
- NO GOLDEN IMAGES
- Adds ~4 to 5 seconds per wafer
- Completely integrated operation and reporting
- Standard ASCII and SECS / GEM reporting with defect size and location
- Broad spectrum OMNI color LED lighting + grazing dark field LED
- Dome reflector used for omni-directional illumination
- 15mpixel color CMOS imaging camera and coaxial light port
- Additional lighting options - combo dark field / bright field
- Excellent for 3D type defects such as EPI “volcanoes”
- Image stack post processing shows “repeaters” and defect clustering
Sorter+ Options (About)
Add Dual and Triple Functionality to Standard Systems
In addition to standalone wafer automation equipment, it is also possible to extend the functionality of your systems with NADAtech’s various Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of specially designed applications, without needing to add extra equipment to your current production floor. Accordingly, each of these products have been listed separately and can be identified by the preceding heading 'Sorter+ Options'.
- NADAtech’s newest Sorter+ Option, designed to meet industry demand
- Module created to help with common visible macro defects
- Add INLINE inspection to your wafer sort
- NO GOLDEN IMAGES
- Adds ~4 to 5 seconds per wafer
- Completely integrated operation and reporting
- Standard ASCII and SECS / GEM reporting with defect size and location
- Broad spectrum OMNI color LED lighting + grazing dark field LED
- Dome reflector used for omni-directional illumination
- 15mpixel color CMOS imaging camera and coaxial light port
- Additional lighting options - combo dark field / bright field
- Excellent for 3D type defects such as EPI “volcanoes”
- Image stack post processing shows “repeaters” and defect clustering
Sorter+ Options (About)
Add Dual and Triple Functionality to Standard Systems
In addition to standalone wafer automation equipment, it is also possible to extend the functionality of your systems with NADAtech’s various Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of specially designed applications, without needing to add extra equipment to your current production floor. Accordingly, each of these products have been listed separately and can be identified by the preceding heading 'Sorter+ Options'.
- NADAtech’s newest Sorter+ Option, designed to meet industry demand
- Module created to help with common visible macro defects
- Add INLINE inspection to your wafer sort
- NO GOLDEN IMAGES
- Adds ~4 to 5 seconds per wafer
- Completely integrated operation and reporting
- Standard ASCII and SECS / GEM reporting with defect size and location
- Broad spectrum OMNI color LED lighting + grazing dark field LED
- Dome reflector used for omni-directional illumination
- 15mpixel color CMOS imaging camera and coaxial light port
- Additional lighting options - combo dark field / bright field
- Excellent for 3D type defects such as EPI “volcanoes”
- Image stack post processing shows “repeaters” and defect clustering
Sorter+ Options (About)
Add Dual and Triple Functionality to Standard Systems
In addition to standalone wafer automation equipment, it is also possible to extend the functionality of your systems with NADAtech’s various Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of specially designed applications, without needing to add extra equipment to your current production floor. Accordingly, each of these products have been listed separately and can be identified by the preceding heading 'Sorter+ Options'.
This equipment is advertised on behalf of NADA Technologies, LLC (NADAtech)